Eric W. Savage
545 W. Hacienda Ave #308, Campbell, CA 95008; 831.345.5598
savage@alumni.cse.ucsc.edu - http://alumni.cse.ucsc.edu/~savage

OBJECTIVE:
Software Engineer for CAD applications or embedded devices
EDUCATION:
M.S., Computer Engineering, University of California, Santa Cruz, Graduated March 2000
B.S., Computer Engineering, University of California, Santa Cruz, Graduated June 1998
Highest Honors in the Major

EXPERIENCE:

6/05-PRESENT Software Engineer
Intel Corporation, Santa Clara Design Technology and Solutions Group
  • Implemented features within an Automatic Test Pattern Generation (ATPG) tool for microprocessors and chips sets.
  • Determined and clarified design team requirements prior to writing specifications for feature development.
  • Maintained GNU autotools based build and specialized regression environments.
  • Ported and validated C++ code through numerous compiler and platform changes.
  • Projects included interactive debug, enhanced ATPG learning, and Design for Test (DFT) validation features through a programming interface.
4/00-6/05
CAD Engineer
Intel Corporation, Santa Clara Design Technology and Solutions Group
  • Worked with a very small team to enable Defect Based Test. Responsibilities included:
    • Productized fault extraction, fault mapping, and fault sampling for several fabrication defect models.
    • Pioneered ATPG execution for several defect models and delivered those test patterns for production testing.
    • Developed and refined innovative methodologies to increase coverage metrics through controlled experiments.
  • Evaluated microprocessor test patterns to identify test holes and help improve product yield. Responsibilities included:
    • Collected test pattern effectiveness through fault simulation on initial and subsequent patterns used to fill test holes.
    • Reported test patterm effectiveness to determine locations of test holes and track progress of subsequent tests.
7/99-9/99;
6/98-9/98
Graduate Intern Technical
Intel Corporation, Santa Clara Design Technology Group
  • Implemented a tool from scratch in C++ that transforms data from a variety of VLSI layout formats. Used layouts from microprocessor functional blocks. Extracted data was passed to an Inductive Fault Analysis (IFA) tool.
  • Developed capabilities that extracted layout information, connected polygons, and propagated electrical net name information within and across metal layers.
  • Validated results and compared run times from industry standard tools.
10/96-7/99 Student Programmer
Computer Engineering Department, University of California, Santa Cruz
  • Worked with a small group on an Inductive Fault Analysis (IFA) tool written in C to identify possible defect locations in VLSI CMOS circuits.
  • Developed and released new features for the IFA tool.
  • Resolved bugs and answered questions from customers.
6/96-9/96
Information Technologies Student Intern
Modesto Irrigation District, IT Department
  • Designed and implemented the District's web page.
  • Installed network clients and network client applications.
  • Installed and upgraded new hardware and resolved software problems.

TOOLS:
    C, C++, Perl, Tcl/Tk, shell scripting, autotools, UNIX, and a variety of assembly languages.
    Limited scope of Python, Javascript, and AJAX.

PUBLICATIONS:
    S. Chakravarty, Y. Chang, E.W. Savage, et al. Experimental Evaluation of Bridge Patterns for a High Performance Microprocessor VTS 2005, pp. 337-342, May 2005
    S. Chakravarty, E.W. Savage, E.N. Tran Defect Coverage Analysis of Partitioned Testing ITC 2004, pp. 907-915, Oct 2004
    S. Chakravarty, A. Jain, E.W. Savage, et al. Experimental Evaluation of Scan Tests for Bridges ITC 2002, pp. 509-518, Oct 2002
    S. Chakravarty, K. Komeyli, E.W. Savage. et al. Layout Analysis to Extract Open Nets Caused by Systematic Failure Mechanisms VTS 2002, pp. 367-372, May 2002